Observation of Initial Stage of Al Epitaxial Growth on Si(111) by Ionized Cluster Beam Deposition

Abstract
The initial stage of Al(111)//Si(111), Al[1̄10]//Si[1̄10] growth at room temperature by ionized cluster beam deposition was observed by reflection electron diffraction. At the initial stage of deposition (less than 10 nm in thickness) Al crystals with (100) plane parallel to the substrate surface nucleated. Three identical Al(100) crystals were found to exist simultaneously, whose azimuthal orientations were respectively Al[011]//Si[2̄11], Al[011]//Si[1̄10] and Al[011]//Si[1̄21̄].

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