Differential Second-Order Raman Spectroscopy
- 2 August 1971
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 27 (5) , 248-250
- https://doi.org/10.1103/physrevlett.27.248
Abstract
It is shown that measurement of the derivative of the second-order Raman spectrum with respect to wavelength of the scattered light gives information on the Van Hove critical points of the combined two-phonon energy function. The results of such a measurement on SrTi at 10°K are presented and discussed.
Keywords
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