A method of X-ray attenuation analysis for approximating the intensity distribution at its point of origin of bremsstrahlung excited in a thick target by incident electrons of constant medium energy

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Abstract
A computer-aided method of analysis of the attenuation by known materials of the exposure rate of a narrow beam of X-radiation generated by a constant medium potential at a thick smooth plane target is described. On the assumption that the average loss of energy of initially monoenergetic electrons is given by the Thomson-Whiddington relation, expressions are derived for the differential intensity of radiation leaving the surface of a solid plane target for a number of analytical approximations to the intensity distribution of the bremsstrahlung at its point of origin within the target. Particular forms of these approximations have been determined which yield attenuation curves closely matching those experimentally determined by Thoraeus for constant exciting potentials of 50, 60, 80 and 100 kV. They are found to be generally consistent with theoretical expectation and the few direct measurements available.