Index of refraction measurement at low temperatures
- 1 May 1991
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 62 (5) , 1214-1218
- https://doi.org/10.1063/1.1142002
Abstract
An apparatus is described for measuring the index of refraction as a function of temperature throughout the visible wavelength region. The apparatus has an accuracy of 1×10−4 in determining the index and has the flexibility to be modified to measure indices at nonvisible wavelengths. The performance and theory of operation are discussed.Keywords
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