Reflectance measurement of the VUV spectrum of solid xenon and its temperature dependence up to the triple point
- 1 January 1981
- journal article
- Published by EDP Sciences in Journal de Physique Lettres
- Vol. 42 (14) , 339-342
- https://doi.org/10.1051/jphyslet:019810042014033900
Abstract
Accurate solid xenon reflectance measurements in the energy range 6.2-10.8 eV are reported. The solid, confined in a closed cell (MgF2 prismatic window), has been studied in the temperature range 80-160 K. The detailed, reliable results allowed the clear observation of the n = 4[Γ(3/2)] term of the excitonic series; its evolution was followed up to 135 K where it disappearsKeywords
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