Structural Characterization of Pt/Co Multilayers for Magnetooptic Recording Using X-Ray Diffraction
- 1 January 1993
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Stress Determination in Textured Thin Films Using X-Ray DiffractionMRS Bulletin, 1992
- Structural refinement of superlattices from x-ray diffractionPhysical Review B, 1992
- Magnetic anisotropy of multilayersJournal of Magnetism and Magnetic Materials, 1991
- Interface anisotropy and chemistry of magnetic multilayers: Au/Co, Pt/Co and Pd/CoJournal of Magnetism and Magnetic Materials, 1991
- Magnetic properties and chemical ordering in Co-PtJournal of Physics: Condensed Matter, 1989
- Stress and property control in sputtered metal films without substrate biasThin Solid Films, 1983
- Internal stresses in Cr, Mo, Ta, and Pt films deposited by sputtering from a planar magnetron sourceJournal of Vacuum Science and Technology, 1982
- Effects of substrate orientation and rotation on internal stresses in sputtered metal filmsJournal of Vacuum Science and Technology, 1979
- Simple analysis of torque measurement of magnetic thin filmsJournal of Applied Physics, 1976