Applications of Focused Ion Beam Systems in Gunshot Residue Investigation
- 1 January 1999
- journal article
- other
- Published by ASTM International in Journal of Forensic Sciences
- Vol. 44 (1) , 105-109
- https://doi.org/10.1520/jfs14419j
Abstract
Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.Keywords
This publication has 7 references indexed in Scilit:
- A focused ion beam secondary ion mass spectroscopy systemJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1995
- Analysis of Primer Residue from CCI Blazer® Lead Free Ammunition by Scanning Electron Microscopy/Energy Dispersive X-RayJournal of Forensic Sciences, 1995
- The Identification of Gunshot Residue Particles from Lead-Free Sintox AmmunitionJournal of Forensic Sciences, 1994
- High-resolution focused ion beamsReview of Scientific Instruments, 1993
- Detection of Gunshot Residues on Hands by Scanning Electron MicroscopyJournal of Forensic Sciences, 1977
- Detection of Gunshot Residue by Use of the Scanning Electron MicroscopeJournal of Forensic Sciences, 1976