Scanning apertureless microscopy below the diffraction limit: Comparisons between theory and experiment
- 20 December 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (25) , 4022-4024
- https://doi.org/10.1063/1.125525
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Observation of nanometer-scale optical property discrimination by use of a near-field scanning apertureless microscopeOptics Letters, 1999
- Facts and artifacts in near-field optical microscopyJournal of Applied Physics, 1997
- Apertureless near-field optical microscopeApplied Physics Letters, 1994