A Second Generation Automated Powder Diffractometer Control System
- 1 January 1982
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Optimization of quantitative X-ray diffraction analysisJournal of Applied Crystallography, 1980
- FN: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexingJournal of Applied Crystallography, 1979
- The reference intensity ratio,I/Ic, for computer simulated powder patternsJournal of Applied Crystallography, 1976
- A silicon powder diffraction standard reference materialJournal of Applied Crystallography, 1975