Use Of Pockers Readout Optical Modulators (PROMS) For Atomic Resolution Electron Image Processing

25 April 1980

proceedings article
Published by SPIE-Intl Soc Optical Eng

p. 154-160
https://doi.org/10.1117/12.958520

Abstract

The usefulness of PROMS for high resolution electron microscopy is outlined. A theoretical model for direct electron beam image storage in PROMS is given, and computed results discussed. Wear-atomic resolution electron images of the Bi₁₂Si0₂₀ crystal structure are shown and discussed.

Keywords

ELECTRONS
IMAGE PROCESSING
OPTICAL MODULATORS
IMAGE STORAGE
CRYSTALS
ELECTRON BEAMS
ELECTRON MICROSCOPY

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