Silica deposition in the inflorescence bracts of wheat (Triticum aestivum). II. X-ray microanalysis and backscattered electron imaging

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Abstract
X-ray microanalysis and backscattered electron imaging were used to investigate silica deposition in the lower glume, lemma, and palea of wheat (Triticum aestivum L. cv. Highbury). In the lemma and glume awns, all of the outer epidermal walls were silicified, with the greatest concentration in prickles and papillae. The glume and lemma had similar structures, exhibiting silicified short cells, prickles, and papillae on both inner and outer surfaces and having macrohairs confined to areas on the inner surfaces beneath the awns. Silicified macrohairs were abundant at the apex and margins of the palea. The results are discussed with respect to previous investigations of grass inflorescence bracts. The applicability of X-ray microanalysis and backscattered electron imaging to the analysis of silica deposits in inflorescence bracts is assessed.