Investigation of the Formation and Structure of Self-assembled Alkylsiloxane Monolayers on Silicon Using In Situ Attenuated Total Reflection Infrared Spectroscopy
- 18 June 1999
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 15 (16) , 5339-5346
- https://doi.org/10.1021/la9900977
Abstract
No abstract availableKeywords
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