Scanning tip microscope for study of electrical inhomogeneity on submicron scale
- 1 January 1990
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 8 (1) , 561-566
- https://doi.org/10.1116/1.576388
Abstract
Spatial variations of sample resistance in electrically inhomogeneous samples were detected by modulating the tip–sample distance and measuring the demodulated signal of reciprocal current, which is proportional to the tunnel resistance. In contrast to featureless maps of sample resistance in Aufilm, maps in a fiber reinforced metal sample exhibited resistive regions which have no corresponding structures in the topography and are considered to originate in the highly insulating whiskers contained in the sample.Keywords
This publication has 0 references indexed in Scilit: