New characterization method of ion current-density profile based on damage distribution of Ga+ focused-ion beam implantation in GaAs
- 1 November 1993
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 11 (6) , 2420-2426
- https://doi.org/10.1116/1.586998
Abstract
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