Stress-relieved magnetoelastic amorphous metal DC magnetometer
- 12 March 1987
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 23 (6) , 280-281
- https://doi.org/10.1049/el:19870204
Abstract
Reduction in the low-frequency stress-induced noise has improved the performance of a magnetoelastic amorphous metal fluxgate magnetometer by a factor of 20. This is accomplished by utilising a viscous fluid interface between the ribbon and its support structure. A minimum detectable field of 120pT/√Hz is demonstrated.Keywords
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