Direct electro-optic sampling of GaAs integrated circuits
- 15 August 1985
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 21 (17) , 765-766
- https://doi.org/10.1049/el:19850539
Abstract
We report the first electro-optic sampling measurements made directly within an integrated circuit. Using the electro-optic effect in GaAs, we have noninvasively probed the internal voltage waveforms of a 2–12 GHz GaAs FET travelling-wave amplifier integrated circuit driven by a microwave signal source.Keywords
This publication has 1 reference indexed in Scilit:
- Electro-Optic Sampler For Gallium Arsenide Integrated CircuitsPublished by SPIE-Intl Soc Optical Eng ,1985