On the Extraction of Pattern Features from Imperfectly Identified Samples
- 1 April 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-21 (4) , 410-411
- https://doi.org/10.1109/TC.1972.5008992
Abstract
The application of Bhattacharyya coefficient for the selection of effective features from imperfectly labeled patterns is examined.Keywords
This publication has 3 references indexed in Scilit:
- An Error Correcting Procedure for Learning with an Imperfect TeacherIEEE Transactions on Systems, Man, and Cybernetics, 1971
- On the best finite set of linear observables for discriminating two Gaussian signalsIEEE Transactions on Information Theory, 1967
- The Divergence and Bhattacharyya Distance Measures in Signal SelectionIEEE Transactions on Communications, 1967