Observations on Equal-Inclination Interference Fringes from a Thin Crystal of Silicon Using Nearly Parallel X-Ray Beam
- 1 October 1971
- journal article
- other
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 31 (4) , 1295-1296
- https://doi.org/10.1143/jpsj.31.1295
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. III. Type II CollimatorJournal of the Physics Society Japan, 1971
- A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging DeviceJapanese Journal of Applied Physics, 1971
- Equal-Thickness Interference Fringes in the Bragg-case Diffraction of X-raysJournal of the Physics Society Japan, 1971
- X-Ray Interference Fringes from a Wedge-Shaped Silicon Single Crystal Obtained by an Incident Plane WaveJournal of the Physics Society Japan, 1968
- Messungen zur Röntgenstrahl-Optik des Idealkristalls. II. Diffraction Pattern mit `Pendellösung' gleicher NeigungActa Crystallographica Section A, 1968