Fortran Programs to Design Mass Spectrometers with Complete Second-Order Focusing
- 1 January 1971
- journal article
- Published by Taylor & Francis in Instrumentation Science & Technology
- Vol. 3 (2) , 165-174
- https://doi.org/10.1080/10739147108543309
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- MASS SPECTROMETERS AND MASS SPECTROGRAPHS CORRECTED FOR IMAGE DEFECTSPublished by Elsevier ,1959
- Second-Order Aberrations in Sector Shaped Electromagnetic AnalyzersReview of Scientific Instruments, 1955
- Angular Aberrations in Sector Shaped Electromagnetic Lenses for Focusing Beams of Charged ParticlesPhysical Review B, 1953