Use of an Auxiliary Sphere with a Spectroreflectometer to Obtain Absolute Reflectance

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Abstract
Reflectance measurements that are made on a scale that is not relative to an arbitrary standard are often called “absolute” measurements. The method presented here uses an auxiliary sphere with a double-beam integrating-sphere spectrophotometer to make measurements on an absolute basis. The basic requirements are: (1) The auxiliary sphere must be uniformly coated with a highly-reflecting, highly-diffusing material; (2) a flat plate must be coated in an identical manner to provide a measure of reflectance of the coating; (3) the interior-surface area of the sphere and the area of the entrance port must be measured.

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