Transport and Defect Mechanisms in Cuprous Delafossites. 2. CuScO2and CuYO2
- 1 December 2004
- journal article
- research article
- Published by American Chemical Society (ACS) in Chemistry of Materials
- Vol. 16 (26) , 5623-5629
- https://doi.org/10.1021/cm048982k
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Preparation of CuAlO2 Films by Wet Chemical SynthesisJournal of the American Ceramic Society, 2002
- Electronic structure and small polaron hole transport of copper aluminatePhysical Review B, 2001
- The Fine Structure of YCuO2+x Delafossite Determined by Synchrotron Powder Diffraction and Electron MicroscopyJournal of Solid State Chemistry, 2001
- Nanocrystalline p-type transparent Cu–Al–O semiconductor prepared by chemical-vapor deposition with Cu(acac)2 and Al(acac)3 precursorsApplied Physics Letters, 2000
- Thin Film Growth of Transparent p-type CuAlO[sub 2]Electrochemical and Solid-State Letters, 1999
- Room Temperature Chemical Oxidation of Delafossite-Type OxidesJournal of Solid State Chemistry, 1994
- Electronic properties of the ordered delafossite-type superoxidesPhysical Review B, 1993
- The optical bandgap and band-edge positions of semiconducting p-type CuYO2Canadian Journal of Physics, 1985
- A new delafossite-type compound CuYO2Journal of Solid State Chemistry, 1983
- Effective ionic radii in oxides and fluoridesActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969