Structural Characterization and Electron Tunneling at n-Si/SiO2/SAM/Liquid Interface
- 1 June 1999
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 103 (25) , 5220-5226
- https://doi.org/10.1021/jp9838184
Abstract
No abstract availableKeywords
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