X-ray diffraction study of the effect of hydrogen atoms on the Si–Si atomic short-range order in amorphous silicon
- 16 April 1979
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 52 (2) , 475-479
- https://doi.org/10.1002/pssa.2210520215
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Plasma preparations of amorphous silicon filmsThin Solid Films, 1978
- On the cohesion of covalent structures of elements in condensed phases. I. — cohesion of σ and π bands in a simple Hückel approximationJournal de Physique, 1978
- Theory of fluctuations and localized states in amorphous tetrahedrally bounded solidsPhysical Review B, 1977
- A comparative study of the structure of evaporated and glow discharge siliconPhysica Status Solidi (a), 1977
- Investigations on the influence of the dihedral angle distribution on the atomic radial distribution function in amorphous Ge and SiJournal of Non-Crystalline Solids, 1974
- Relaxed continuous random network modelsJournal of Non-Crystalline Solids, 1974
- Amorphous germanium II. Structural propertiesAdvances in Physics, 1973
- Electronic Properties of an Amorphous Solid. I. A Simple Tight-Binding TheoryPhysical Review B, 1971
- Structural model for amorphous silicon and germaniumJournal of Non-Crystalline Solids, 1971