IR ellipsometry of the highly anisotropic materials α-SiO2 and α-Al2O3
- 1 October 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 234 (1-2) , 332-336
- https://doi.org/10.1016/0040-6090(93)90280-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Raman Spectrum of QuartzNature, 1945