Thickness dependence of the transverse Kerr effect in thin ferromagnetic films
- 11 July 1977
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 10 (10) , L131-L134
- https://doi.org/10.1088/0022-3727/10/10/002
Abstract
The thickness dependence of the transverse Kerr magneto-optic effect in thin magnetic films is obtained by including the effect of multiple internal reflections in the theoretical analysis. By using bulk values of the refractive index (N=n+ik) and complex magneto-optic parameter (Q=Q1+iQ2) measured by Krinchik (1959), the reduced reflectivity difference delta is computed for thin films of iron, nickel and cobalt. Reduced reflectivity differences are presented as a function of the film thickness for two angles of incidence and for wavelengths in the range 0.43-0.69 mu m.Keywords
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