Determination of the Exchange Coupling Strengths for Fe/Au/Fe
- 6 October 1997
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 79 (14) , 2734-2737
- https://doi.org/10.1103/physrevlett.79.2734
Abstract
We measure, as a function of interlayer thickness, the magnitude of the bilinear exchange coupling in an Fe/Au/Fe trilayer, to investigate the existing order of magnitude discrepancy between theory and experiment. We use Fe whisker substrates, scanning electron microscopy polarization analysis, and reflection high-energy electron diffraction to monitor the sample's magnetic and physical structure, and confocal magneto-optical Kerr effect to determine the coupling. We determine the exchange coupling strengths of the individual oscillating terms. The total bilinear coupling strength is , for a Au interlayer thickness of 4 monolayers, in substantial agreement with current theory.
Keywords
This publication has 20 references indexed in Scilit:
- Spin-dependent interface transmission and reflection in magnetic multilayers (invited)Journal of Applied Physics, 1996
- Theory of interlayer magnetic couplingPhysical Review B, 1995
- Spin current and exchange coupling in magnetic multilayersMaterials Science and Engineering: B, 1995
- Oscillatory exchange coupling in Fe/Au/Fe(100)Journal of Applied Physics, 1994
- Interlayer coupling across noble metal spacersJournal of Magnetism and Magnetic Materials, 1993
- Exchange coupling in magnetic heterostructuresPhysical Review B, 1993
- Analysis of bilinear and biquadratic exchange coupling in Fe/Ag/Fe(001) trilayersJournal of Applied Physics, 1993
- Oscillatory coupling between ferromagnetic layers separated by a nonmagnetic metal spacerPhysical Review Letters, 1991
- Oscillations in exchange coupling and magnetoresistance in metallic superlattice structures: Co/Ru, Co/Cr, and Fe/CrPhysical Review Letters, 1990
- Layered Magnetic Structures: Evidence for Antiferromagnetic Coupling of Fe Layers across Cr InterlayersPhysical Review Letters, 1986