Multiple Photoionization of the Rare Gases
- 7 October 1974
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 33 (15) , 875-878
- https://doi.org/10.1103/physrevlett.33.875
Abstract
The photoionization yield or average charge produced per photon absorbed by Ne, Ar, Kr, and Xe has been measured from the threshold of double photoionization to 107 eV. The probability of double ionization is zero at threshold for the rare gases. For Ar, Kr, and Xe double ionization increases rapidly giving an abundance of 16 to 30% at 20 eV beyond the double-ionization threshold. In this region double ionization is constant or increasing slowly. At the threshold for triple ionization the average charge per photon increases rapidly.Keywords
This publication has 15 references indexed in Scilit:
- Correlation Effect and Double Electron Ejection in the Photoabsorption ProcessPhysical Review Letters, 1971
- Multiple ionization of He and Ne by 10 keV electrons as a function of the energy lossPhysica, 1971
- Multiple ionization of Ar by 10 keV electrons as a function of the energy lossPhysica, 1971
- Small-angle scattering of 10 keV electrons in Hw, Ne, and ArPhysica, 1970
- Multiple ionization of Kr and Xe by 2–14 keV electronsPhysica, 1970
- Multiple Photo-Ionization of XenonPhysical Review B, 1969
- Multiple ionization of He, Ne and Ar by 2–16 keV electronsPhysica, 1969
- On the double ionization mechanismPhysics Letters A, 1968
- Multiple Ionization Processes in HeliumPhysical Review B, 1967
- Double Electron Ejection Resulting from Photo-Ionization in the Outermost Shell of He, Ne, and Ar, and Its Relationship to Electron CorrelationPhysical Review B, 1967