Studies of Bonding Mechanisms and Failure Modes in Thermocompression Bonds of Gold Plated Leads to Ti-Au Metallized Substrates
- 1 March 1971
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
- No. 07350791,p. 178-186
- https://doi.org/10.1109/irps.1971.362512
Abstract
An adequate gold-to-gold weld requires (1) a bonding load large enough to produce good interfacial conformity and (2) a bond interface temperature high enough to effect contaminant dispersal. Although some tradeoff between bonding load and temperature is possible, the range of successful combinations is inherently limited by the fact that one member is a thin film.Keywords
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