How failure prediction methodology affects electronic equipment design

• 1 September 1990
• journal article
• research article
• Published by Wiley in Quality and Reliability Engineering International
• Vol. 6  (4) , 243-249
• https://doi.org/10.1002/qre.4680060406

Abstract

Keywords

• FAILURE PREDICTION METHODOLOGY
• RELIABILITY PREDICTION
• TEMPERATURE EFFECTS
• AVIONICS RELIABILITY
• MIL-HDBK-217
• MEASURED RELIABILITY