The Development of Atom Probe Field-Ion Microscopy
- 1 January 2000
- journal article
- Published by Elsevier in Materials Characterization
- Vol. 44 (1-2) , 11-27
- https://doi.org/10.1016/s1044-5803(99)00053-4
Abstract
No abstract availableKeywords
This publication has 31 references indexed in Scilit:
- Field ion microscope studies of single-atom surface diffusion and cluster nucleation on metal surfacesSurface Science Reports, 1994
- Energy deficits in pulsed field evaporation and deficit compensated atom-probe designsReview of Scientific Instruments, 1974
- Multiple-focusing time-of-flight mass spectrometers Part II. TOFMS with equal energy accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1972
- Calibration of the Atom Probe FIMReview of Scientific Instruments, 1969
- Mass spectrometric analysis of low temperature field evaporationSurface Science, 1968
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968
- Feldverdampfung von Platin bei hohen Temperaturen im Ultrahochvakuum und in Gegenwart von Sauerstoff: massenspektrometrische Analyse der OberflächenkomplexeZeitschrift für Naturforschung A, 1966
- Field Ionization and Field Ion MicroscopyPublished by Elsevier ,1960
- Das FeldionenmikroskopThe European Physical Journal A, 1951
- Elektronenmikroskopische Beobachtungen von FeldkathodenThe European Physical Journal A, 1937