A Fully Automated On-Wafer Pulsed Measurement System, with Variable Pulse-Length and Duty Cycle, for Accurate Large Signal FET Modeling
- 1 October 1989
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 569-575
- https://doi.org/10.1109/euma.1989.334029
Abstract
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