A Structural Study of Co-Sb Multilayered Film by X-Ray Diffraction
- 1 April 1986
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 25 (4R) , 552
- https://doi.org/10.1143/jjap.25.552
Abstract
The structure of a multilayered film, [Co(30 Å)-Sb(25 Å)]70, prepared by vacuum deposition is investigated by using mainly X-ray diffraction. It is revealed that the Co layer has a hcp structure with [110] texture while the Sb layer does not show any distinct texture. The relative intensities and the line width of Bragg reflections are interpreted on the assumption of a very thin compound layer at each interface and also a small distribution of Sb layer thickness. Preliminary results from electron microscopic analyses are also briefly introduced.Keywords
This publication has 6 references indexed in Scilit:
- Structural Aspects of Fe–Mg Artificial Superstructure Films Studied by X-Ray DiffractionJournal of the Physics Society Japan, 1986
- Magnetic structure of multiple bilayers of thin films of Fe and GeJournal of Applied Physics, 1985
- 59Co NMR Observation for Compound Formation at Interface of Co-Sb Multilayered FilmJournal of the Physics Society Japan, 1984
- Interface Magnetism of Fe–Sb Multilayered Films with Artificial Superstructure from 57Fe and 121Sb Mössbauer Spectroscopy, Neutron Diffraction and FMR ExperimentsJournal of the Physics Society Japan, 1983
- Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performanceApplied Optics, 1981
- Structural investigations of thin antimony filmsJournal of Crystal Growth, 1976