Real-Time X-Ray Topographic Observation of Crystal Growth of Gallium from Melt
- 1 March 1986
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 25 (3R)
- https://doi.org/10.1143/jjap.25.345
Abstract
The growth of gallium single crystal of 99.9999% purity from the melt was observed by real-time X-ray topography. At the solid-liquid interface, (010), (011), (101) and (111) facets were observed. Dislocations, which intersected the facets and propagated into a newly grown crystal, did not influence the faceted growth. The growth mechanism of the faceted growth of gallium is deduced from continuous observation of the growth process.Keywords
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