Optical microscopic, X-ray diffraction, and electrical resistance studies of CuCl at high pressure
- 1 October 1979
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 32 (4) , 275-279
- https://doi.org/10.1016/0038-1098(79)90946-3
Abstract
No abstract availableKeywords
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