Finite-element simulation of GaAs MESFET's with lateral doping profiles and submicron gates

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Abstract
Results of a two-dimensional finite-element simulation of a GaAs MESFET are presented. The simulation is used to determine the drain current and transconductance as well as the two-dimensional voltage, electron density, and electric-field distributions. It is shown that placement of a compensated doping region in the high electric-field region between gate and drain increases the drain current and transconductance by reducing the velocity-saturation effect. The transconductance and drain conductance of the MESFET in the saturation region of devices having different channel heights are compared with previous analysis.