Current-phase relations as determinants of superconducting thin-film weak-link I-V characteristics

Abstract
The dc I‐Vcharacteristics of superconducting thin‐film Sn‐Au proximity bridges and uniform‐thickness Sn microbridges have been carefully analyzed as a function of the directly measured current‐phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I‐Vcharacteristics are very well described by a shunted weak‐link model that includes the proper dc CPR and a shunt resistance.