Characterization of (In,Ga)As/GaAs strained-layer multiple quantum wells with high-resolution X-ray diffraction and computer simulations
- 1 June 1991
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 50 (1-4) , 92-96
- https://doi.org/10.1016/0169-4332(91)90144-9
Abstract
No abstract availableKeywords
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