Abstract
Recently near-ultraviolet electroluminescence (EL) was observed from a typical Si-backbone polymer, poly(methylphenylsilane) (PMPS). This study investigates the dependence of the EL characteristics on temperature, the electron injecting electrodes and the “defect” concentration at the interface between PMPS and electron injecting electrodes, in order to clarify the EL process in PMPS-LEDs.