Study of basic mechanisms of single event upset using high-energy microbeams
- 1 March 1991
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 54 (1) , 407-410
- https://doi.org/10.1016/0168-583x(91)95545-o
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodesIEEE Transactions on Nuclear Science, 1988
- Transient Measurements of Ultrafast Charge Collection in Semicouductor DiodesIEEE Transactions on Nuclear Science, 1987