Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry
- 25 November 2005
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 410-411, 169-173
- https://doi.org/10.1016/j.msea.2005.08.070
Abstract
No abstract availableKeywords
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