Measurement of absolute reflectance at nearly normal incidence
- 1 July 1982
- journal article
- Published by IOP Publishing in Journal of Optics
- Vol. 13 (4) , 207-208
- https://doi.org/10.1088/0150-536x/13/4/005
Abstract
Describes an apparatus for the measurement of absolute specular reflectance at nearly normal incidence. The reflectance of the samples is calculated from four different measurements. This apparatus is particularly convenient for high reflectance samples.Keywords
This publication has 3 references indexed in Scilit:
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- Interference-Enhanced PhotoemissionApplied Optics, 1968
- Precision Measurement of Absolute Specular Reflectance with Minimized Systematic ErrorsJournal of the Optical Society of America, 1960