On the analysis of pulsed MOS capacitance measurement
- 30 September 1978
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 21 (9) , 1171-1173
- https://doi.org/10.1016/0038-1101(78)90356-8
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Exact modeling of the transient response of an MOS capacitorIEEE Transactions on Electron Devices, 1975
- On the determination of minority carrier lifetime from the transient response of an MOS capacitorIEEE Transactions on Electron Devices, 1967