Surface-structure and work-function determinations for Silicon crystals
- 1 January 1959
- journal article
- Published by Elsevier in Journal of Physics and Chemistry of Solids
- Vol. 8, 116-118
- https://doi.org/10.1016/0022-3697(59)90290-2
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low-Energy Electron DiffractionJournal of Applied Physics, 1958
- Work-Function Studies of Germanium Crystals Cleaned by Ion BombardmentJournal of Applied Physics, 1957