Increasing the performance of MAP (multi-angled parallelism) erosion-dilation for feature extraction through unary/binary operations
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. ii, 524-528
- https://doi.org/10.1109/icpr.1990.119419
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- MAP: Multi-angled parallelism for feature extraction from topographical mapsPattern Recognition, 1991
- A process for detecting defects in complicated patternsComputer Graphics and Image Processing, 1973