Parameter fluctuations and low frequency noise in Josephson junction devices

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Abstract
A model is presented for a possible source of low frequency (1/f) noise in the dc superconducting quantum interferometer device (SQUID). Thermal fluctuations within the device are assumed to generate low frequency fluctuations in the device parameters. The resultant parameter fluctuations induce fluctuations in the device characteristics. As an example, low frequency voltage noise spectral densities are computed as a function of temperature and applied flux. In addition, low frequency variations in the forward transfer function of the SQUID are predicted. The model can be generalized to predict low frequency noise generated by parameter fluctuations in other Josephson junction circuits.