Waveguide ultrasonic force microscopy at 60 MHz
- 3 April 2000
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (14) , 1836-1838
- https://doi.org/10.1063/1.126184
Abstract
We present measurements using ultrasonic force microscopy at ∼60 MHz , operating in a “waveguide” mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Gequantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson–Kendall–Roberts model of the force-distance curve.Keywords
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