Waveguide ultrasonic force microscopy at 60 MHz

Abstract
We present measurements using ultrasonic force microscopy at ∼60 MHz , operating in a “waveguide” mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Gequantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson–Kendall–Roberts model of the force-distance curve.

This publication has 9 references indexed in Scilit: