The use of exafs in the study of defect clusters in doped CaF 2
- 1 January 1983
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 75 (1) , 159-168
- https://doi.org/10.1080/00337578308224697
Abstract
The results of a study of the local structural environment of dopant ions in CaF2 using the EXAFS technique are reported and compared with data for the same systems obtained from neutron diffraction and computer simulation studies. It is shown that the local structure surrounding the dopant ion is different for Er-doped and La-doped CaF2. The observed fine-structure is compatible with an octahedral cluster of dopant ions and fluoride interstitials, in the case of Er-doped CaF2, and an interstitial-dopant dimer which has captured an additional fluoride interstitial, in the case of La-doped CaF2.Keywords
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