Fitting reflectivity data from liquid crystal cells using genetic algorithms

Abstract
The half-leaky guided mode technique for quantifying thin optical layers is here combined with a data fitting routine based on a genetic algorithm to provide an immensely powerful procedure for detailing the director profile in liquid crystal cells. This approach not only provides a full description of the optical parameters of the cell, but also gives quantitative uncertainties in these parameters. It is tested here, first by fitting to theoretically produced data and then applied to real experimental data.

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