A Graphite Crystal Polarimeter for Stellar X-Ray Astronomy
- 1 July 1972
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 43 (7) , 967-976
- https://doi.org/10.1063/1.1685840
Abstract
The first crystal x‐ray polarimeter to be used for x‐ray astronomy is described. Polarization is measured by modulation of the x rays diffracted at an average 45° glancing angle from large, curved graphite crystal panels as these rotate about an axis parallel to the incident x‐ray flux. Arrangement of the crystal panels, the design of the detector, and the signal‐processing circuitry were optimized to minimize systematic effects produced by off‐axis pointing of the rocket and cosmic ray induced events. The in‐flight performance of the instrument in relation to the observed background signal is discussed.Keywords
This publication has 3 references indexed in Scilit:
- Use of Highly Reflecting Crystals for Sp@ctroscopy and Polarimetry in X-Ray AstronomyThe Astronomical Journal, 1970
- The Spectrum of Diffuse Cosmic X-Rays 1-13 keVThe Astrophysical Journal, 1969
- Reduction of Cosmic Background in an X-Ray Proportional Counter through Risetime DiscriminationReview of Scientific Instruments, 1968