Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z .ltoreq. 4500
- 1 May 1988
- journal article
- research article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 60 (9) , 938-944
- https://doi.org/10.1021/ac00160a021
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: